The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2021
Filed:
Jun. 24, 2020
Tsinghua University, Beijing, CN;
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Wei-Chen Wu, Beijing, CN;
Jun Zhu, Beijing, CN;
Guo-Fan Jin, Beijing, CN;
Shou-Shan Fan, Beijing, CN;
Tsinghua University, Beijing, CN;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Abstract
The present invention relates to a method for designing a freeform surface reflective imaging system, comprising: selecting an initial system, wherein an FOV of the initial system is X×Y; selecting an FOV sequence as [X, Y], [X, Y], [X, Y], . . . , [X, Y], while the FOV of the system to be designed is X×Y, and X<X<X< . . . <X, Y<Y<Y< . . . <Y; using point-by-point methods to construct all freeform surfaces of the initial system in the FOV of X×Y; setting the system obtained in the last step as a second initial system for system construction in the FOV of X×Y; repeating the last step to execute system construction in the order of the FOV sequence until the final FOV X×Yis obtained.