The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2021

Filed:

Aug. 24, 2020
Applicant:

Massachusetts Institute of Technology, Cambridge, MA (US);

Inventors:

Oguzhan Murat Onen, Boston, MA (US);

Marco Turchetti, Cambridge, MA (US);

Karl K. Berggren, Arlington, MA (US);

Brenden Butters, Cambridge, MA (US);

Mina Bionta, Somerville, MA (US);

Phillip Donald Keathley, Natick, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 39/10 (2006.01); H01L 39/18 (2006.01); H01L 31/101 (2006.01); G01J 1/42 (2006.01);
U.S. Cl.
CPC ...
H01L 39/10 (2013.01); G01J 1/42 (2013.01); H01L 31/101 (2013.01); H01L 39/18 (2013.01);
Abstract

A device that is a combination of a superconducting nanowire single-photon detector and a superconducting multi-level memory. These devices can be used to count a number of photons impinging on the device through single-photon to single-flux conversion. Electrical characterization of the device demonstrates single-flux quantum (SFQ) separated states. Optical measurements using attenuated laser pulses with different mean photon number, pulse energies and repetition rates are shown to differentiate single-photon detection from other possible phenomena, such as multiphoton detection and thermal activation. Array devices and methods are also discussed.


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