The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2021

Filed:

Feb. 14, 2020
Applicants:

Dh Technologies Development Pte. Ltd., Singapore, SG;

Université Claude Bernard Lyon 1, Villeurbanne, FR;

Centre National DE LA Recherche Scientifique, Paris, FR;

École Normale Supérieure DE Lyon, Lyons, FR;

Inventor:

Jerome Lemoine, Lucenay, FR;

Assignee:

Other;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0045 (2013.01); H01J 49/0031 (2013.01);
Abstract

A plurality of MRM transitions to be used to monitor a sample are received and divided into two or more contiguous groups. At least one sentinel transition is selected in each group that identifies a next group of the two or more contiguous groups that is to be monitored. A first group of the two or more contiguous groups is placed on a duty cycle list of the tandem mass spectrometer. One or more compounds are separated from the sample and ionized, producing an ion beam. A series of MRM transitions read from the duty cycle list are executed on the ion beam by the tandem mass spectrometer. When at least one sentinel transition of the first group is detected, a next group identified by the sentinel transition is placed on the list.


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