The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2021

Filed:

Aug. 01, 2018
Applicant:

Gatan, Inc., Pleasanton, CA (US);

Inventors:

Edward Michael James, San Francisco, CA (US);

Ray Dudley Twesten, Livermore, CA (US);

Assignee:

Gatan, Inc., Pleasanton, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/26 (2006.01); H01J 37/22 (2006.01); H01J 37/24 (2006.01); H01J 37/05 (2006.01); H01J 37/244 (2006.01);
U.S. Cl.
CPC ...
H01J 37/268 (2013.01); H01J 37/05 (2013.01); H01J 37/224 (2013.01); H01J 37/244 (2013.01); H01J 37/265 (2013.01); H01J 2237/2446 (2013.01); H01J 2237/24485 (2013.01);
Abstract

A system and method are disclosed for acquiring Electron Energy Loss Spectrometry (EELS) spectra in a transmission electron microscope. The inventive system and method maximize spectrum acquisition rate and duty cycle by exposing a first portion of an image sensor to a first spectrum while a previously exposed potion of the sensor is read out of the sensor during some or all of the exposure time.


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