The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2021
Filed:
Aug. 31, 2018
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Maria H. Oleszkiewicz, Smardzowice, PL;
Blazej R. Rutkowski, Cracow, PL;
Wojciech Sobala, Cracow, PL;
Piotr Padkowski, Lodz, PL;
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 3/40 (2006.01); G06T 7/70 (2017.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
G06T 3/4007 (2013.01); G06T 3/4061 (2013.01); G06T 5/50 (2013.01); G06T 7/70 (2017.01); G06T 2207/10008 (2013.01); G06T 2207/10088 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/10132 (2013.01); G06T 2207/20224 (2013.01);
Abstract
A system for enhancing a set of object scan images may be provided. The set of object scan images may also here comprise at least a first scan image, located at a distance therefrom a second scan image.
Quick Actions:
Oleszkiewicz, Maria. (2021). Reconstructing missing slices in slice-based scans of 3d objects (U.S. Patent No. 11024004). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11024004
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile