The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2021

Filed:

Jul. 23, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Uri Kartoun, Cambridge, MA (US);

Fang Lu, Billerica, MA (US);

Meenal Pore, Nairobi, KE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06N 3/08 (2006.01); G06T 11/00 (2006.01); G01R 33/48 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6268 (2013.01); G01R 33/4818 (2013.01); G06K 9/6249 (2013.01); G06K 9/6262 (2013.01); G06K 9/6284 (2013.01); G06N 3/08 (2013.01); G06T 11/003 (2013.01); G06K 2209/05 (2013.01); G06T 2207/10088 (2013.01);
Abstract

A system, method and program product for implementing a sparse sampling strategy for acquiring MRI data. A method includes: collecting and labeling a training dataset of MRI scans for a predetermined diagnostic; selecting a sampling shape and associated parameter values; sampling each MRI scan in the training data set using the sampling shape and associated parameter values to generate a set of sparse samples; training a neural network using the sparse samples and assigning an accuracy to a resulting trained neural network; and adjusting the associated parameter values, and repeating the sampling and training until optimized parameter values are established.


Find Patent Forward Citations

Loading…