The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2021
Filed:
Apr. 03, 2020
Imperva, Inc., San Mateo, CA (US);
Itsik Mantin, Shoham, IL;
Craig Burlingame, Mounds View, MN (US);
Brian Anderson, San Diego, CA (US);
Kunal Anand, Los Angeles, CA (US);
Ran Rosin, Ramat Hasharon, IL;
Peter Klimek, Seattle, WA (US);
Joseph Moore, San Diego, CA (US);
Imperva, Inc., San Mateo, CA (US);
Abstract
A method for detecting anomalies in audit logs of database operations performed on databases. The method includes obtaining a first audit log of database operations performed on one or more databases, generating, for each of a plurality of attribute values associated with a designated attribute appearing in the first audit log, a profile of that attribute value that indicates expected attribute characteristics of one or more attributes when that attribute value is associated with the designated attribute, obtaining a second audit log of further database operations performed on the one or more databases, and detecting an anomaly responsive to a determination that a log entry in the second audit log includes an attribute value associated with the designated attribute but attributes in the log entry deviate from the expected attribute characteristics of the one or more attributes indicated by the profile of the attribute value associated with the designated attribute.