The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2021
Filed:
Aug. 04, 2016
International Business Machines Corporation, Armonk, NY (US);
Sebastian Nelke, Frickenhausen, DE;
Martin Oberhofer, Bondorf, DE;
Yannick Saillet, Stuttgart, DE;
Jens P. Seifert, Gaertringen, DE;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Embodiments of the present invention disclose generating a data profiling jobs for source data in a data processing system, the source data being described by at least one source functional data model. A target functional data model is provided, for describing target data that can be generated from the source data. One or more source functional data models are identified that correspond to the target functional data model. At least one functional source-to-target model mapping is associated to at least one source-target pair based on the target functional data model and identified source functional data models. A physical source-to-target model mapping for at least one source-target pair based on the logical source-to-target model mapping is calculated. For all physical source attributes, the needed data profiling jobs are generated based on the target attribute for analyzing the physical source attributes.