The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2021
Filed:
Feb. 28, 2020
International Business Machines Corporation, Armonk, NY (US);
Deborah A. Furman, Staatsburg, NY (US);
Andrew C. M. Hicks, Wappingers Falls, NY (US);
Ryan Thomas Rawlins, New Paltz, NY (US);
Michael E. Gildein, Wappingers Falls, NY (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A method for detecting and localizing a fault in a system under test (SUT) includes generating an initial set of test vectors that provides complete n-wise coverage of the reduced test space. The method further includes generating an initial set of test cases from the initial set of test vectors and executing the initial set of test cases. The method further includes generating a set of new test cases from a selected failing test case, wherein generating the set of new test cases comprises generating, in relation to each attribute in the selected failing test case, a respective subset of new test cases at least in part by changing a respective attribute value for the attribute in the selected failing test case to each other candidate attribute value for the attribute that is not present in any of the one or more test cases that failed execution.