The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2021
Filed:
Jan. 24, 2019
Oracle International Corporation, Redwood Shores, CA (US);
Sampanna Shahaji Salunke, Dublin, CA (US);
Dustin Garvey, Exeter, NH (US);
Sumathi Gopalakrishnan, Fremont, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
The present disclosure describes a flexible technique to learn patterns in time series data that recur over time. The patterns may be used for simulation, predicting future behavior, or detecting anomalies in a system in which the data is collected. The technique incrementally detects daily, weekly, monthly, and yearly patterns. Each pattern is built over time instead of requiring all the data to be available at the beginning of the analysis. Instead of modeling each pattern explicitly, each pattern is described in the context of a day and formed based on time series data collected over an entire day. An example use of the technique is detecting load patterns in a computer system. A metric of system load such as CPU utilization may be collected periodically over a day. The techniques presented herein capture multiple daily models, each representing a different load pattern.