The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2021

Filed:

Nov. 27, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

David J. Crighton, Horton Heath, GB;

Martin R. Naish, Newbury, GB;

David Robert Coles, Hants, GB;

Paul J. Lacy, Havant, GB;

Kirstine F. L. Clapperton, Fordingbridge, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0721 (2013.01); G06F 11/0751 (2013.01); G06F 11/0778 (2013.01);
Abstract

Concepts for logging and retrieving diagnostic information relating to a computer system that implements a runtime stack when executing a program are presented. One example comprises, determining a depth value, the depth value being configured to identify a level of diagnostic tracing for the runtime stack. For each stack frame of the runtime stack: the depth value is compared with a counter value associated with the stack frame, and data is then retrieved from the stack frame based on the comparison result.


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