The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2021

Filed:

Nov. 25, 2015
Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Ryouhei Yasuda, Kanagawa, JP;

Takuro Noda, Tokyo, JP;

Assignee:

SONY CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/01 (2006.01); G06F 3/0346 (2013.01); B60R 16/037 (2006.01); G06F 3/00 (2006.01); G06F 3/038 (2013.01); G06F 3/0481 (2013.01);
U.S. Cl.
CPC ...
G06F 3/013 (2013.01); B60R 16/037 (2013.01); G06F 3/002 (2013.01); G06F 3/01 (2013.01); G06F 3/038 (2013.01); G06F 3/0346 (2013.01); G06F 3/04817 (2013.01);
Abstract

Provided is an information processing device and a control method that can eliminate the need for an operation merely for line-of-sight detection calibration and can perform line-of-sight detection calibration in a normal user operation. An information processing device including a recognition unit to recognize a position of a target of gaze following a user operation, a line-of-sight detection unit to detect a line-of-sight position of a user during the user operation, and a line-of-sight detection adjustment unit to perform an adjustment to line-of-sight detection performed by the line-of-sight detection unit on the basis of the recognized position of the target of gaze and the line-of-sight position.


Find Patent Forward Citations

Yasuda, Ryouhei. (2021). Line of sight detection adjustment unit and control method (U.S. Patent No. 11023038). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11023038

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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