The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2021

Filed:

Jan. 24, 2020
Applicant:

Ajou University Industry-academic Cooperation Foundation, Suwon-si, KR;

Inventors:

Hoeseok Yang, Suwon-si, KR;

Beomsik Kim, Cheonan-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/32 (2019.01); G06F 1/20 (2006.01); G06F 1/3206 (2019.01); G06F 1/3234 (2019.01);
U.S. Cl.
CPC ...
G06F 1/206 (2013.01); G06F 1/203 (2013.01); G06F 1/3206 (2013.01); G06F 1/3243 (2013.01);
Abstract

The present disclosure relates to an apparatus and method for improving thermal cycling reliability of a multicore microprocessor, and a method for a method for improving thermal cycling reliability of a multicore microprocessor according to an embodiment of the present disclosure includes determining an optimal temperature of a microprocessor to maximize a mean time to failure of the microprocessor, and increasing at least one of an operating frequency of the microprocessor or a processor utilization of the microprocessor to make a temperature of the microprocessor equal to or higher than the optimal temperature.


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