The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2021

Filed:

Oct. 12, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Matthias Ringe, Tuebingen, DE;

Andreas H. A. Arp, Nufringen, DE;

Michael V. Koch, Ehningen, DE;

Fatih Cilek, Boeblingen, DE;

Thomas Makowski, Pfullingen, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/39 (2020.01); G06F 1/10 (2006.01); G06F 30/396 (2020.01);
U.S. Cl.
CPC ...
G06F 1/10 (2013.01); G06F 30/39 (2020.01); G06F 30/396 (2020.01);
Abstract

According to one or more embodiments of the present invention, a computer-implemented method includes determining, for a first sector from multiple sectors of a clock mesh of a semiconductor circuit, a set of mesh wires. The method further includes generating tapping point candidates, selecting a first combination of tapping points, and performing an analog electrical simulation of a clock signal. The simulation includes feeding the clock signal into the clock mesh via the first combination of tapping points via a clock signal transmitter, and measuring delays for the clock signal to reach a set of measuring nodes. The maximum delay from the measured delays is selected, and, in response to the maximum delay being less than a previous delay value, the first combination of tapping points is used to connect sector buffers from the first sector to the clock mesh.


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