The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2021
Filed:
Aug. 28, 2019
Tamron Co., Ltd., Saitama, JP;
Yasuhiko Obikane, Saitama, JP;
Yoshito Iwasawa, Saitama, JP;
Yuichi Imamiya, Saitama, JP;
Yuri Koyama, Saitama, JP;
TAMRON CO., LTD., Saitama, JP;
Abstract
An observation imaging apparatus includes an insertion unit, an imaging lens, and an image sensor. The imaging lens is disposed in such a manner that an axial principal ray of an observation subject side surface of a lens is tilted with respect to a normal line passing through the center of gravity of a section of the insertion unit, the section passing through the center of an effective imaging range of the image sensor and having the smallest area. A point on the axial principal ray at which the distance between the normal line and the axial principal ray is smallest is located on the image side relative to the observation subject side surface of the lens and on the observation subject side relative to the image sensor. The observation imaging apparatus satisfies a predetermined conditional expression.