The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2021

Filed:

Sep. 04, 2020
Applicant:

Beihang University, Beijing, CN;

Inventors:

Kun Fang, Beijing, CN;

Yanbo Zhu, Beijing, CN;

Zhen Gao, Beijing, CN;

Zhipeng Wang, Beijing, CN;

Assignee:

BEIHANG UNIVERSITY, Beijing, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01S 19/20 (2010.01); G01S 19/08 (2010.01); G01S 19/07 (2010.01); G01S 19/23 (2010.01);
U.S. Cl.
CPC ...
G01S 19/20 (2013.01); G01S 19/074 (2019.08); G01S 19/08 (2013.01); G01S 19/23 (2013.01);
Abstract

A GBAS integrity risk allocation system based on key satellites is used to perform a GBAS integrity risk allocation method, including: reading data from an ephemeris at a certain time, and determining numbers of key satellites, key satellite pairs and key satellite groups at a certain time; under H2 hypothesis, allocating the integrity risks by using the fault probability of satellites in key satellite pairs or key satellite groups, where the integrity risks allocated by using the fault probability of satellites in key satellite pairs or key satellite groups include integrity risks caused by dual-receiver fault and integrity risks caused by ranging source fault; under H0 and H1 hypotheses, allocating the integrity risks by using the fault probability of non-key satellites; making an integrity allocation table according to the integrity risk allocation under the H0, H1 and H2 hypotheses.


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