The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2021
Filed:
Jul. 16, 2019
Applicant:
Arm Limited, Cambridge, GB;
Inventors:
Balaji Venu, Cambridge, GB;
Reiley Jeyapaul, Austin, TX (US);
Assignee:
Arm Limited, Cambridge, GB;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/367 (2020.01); G06F 30/33 (2020.01); G06F 30/30 (2020.01); G01R 31/00 (2006.01); G01R 31/317 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31718 (2013.01); G06F 30/367 (2020.01); G06F 11/008 (2013.01); G06F 30/30 (2020.01); G06F 30/33 (2020.01);
Abstract
An apparatus is provided to measure vulnerability of a circuit to transient errors. The circuit includes processing circuitry and a plurality of flops. The apparatus includes categorisation obtaining circuitry that obtains a vulnerability categorisation of the flops. The vulnerability categorisation indicates whether each flop is vulnerable, conditionally vulnerable, or isolated. Analysis circuitry determines, for at least one cycle of the processing circuitry, a set of the flops that are currently vulnerable, based on the vulnerability categorisation of the flops.