The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2021

Filed:

Sep. 13, 2019
Applicant:

Reid-ashman Manufacturing, Inc., St. George, UT (US);

Inventor:

Scott Nelson, Phoenix, AZ (US);

Assignee:

Reid-Ashman Manufacturing, Inc., St. George, UT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 1/073 (2006.01); G01R 1/04 (2006.01);
U.S. Cl.
CPC ...
G01R 1/07342 (2013.01); G01R 1/0408 (2013.01); G01R 31/2831 (2013.01);
Abstract

Various implementations of automatic test equipment are disclosed having a number of innovative features. In one implementation, the equipment includes a test head having a probe card support apparatus that provides stiffening support and/or planarization to the device under test (DUT) area of a probe card. In another implementation, the test head can include a planar surface and the wafer prober can include a corresponding planar surface. The planar surfaces can be brought into contact with each other to planarize the DUT area of the probe card and the wafer chuck in the wafer prober relative to each other.


Find Patent Forward Citations

Nelson, Scott. (2021). Probe card support apparatus for automatic test equipment (U.S. Patent No. 11022628). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11022628

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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