The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2021
Filed:
May. 19, 2014
Commissariat À L'énergie Atomique ET Aux Énergies Alternatives, Paris, FR;
Biomérieux, Marcy l'Etoile, FR;
Pierre Marcoux, Saint Egreve, FR;
Mathieu Dupoy, Grenoble, FR;
COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES, Paris, FR;
BIOMERIEUX, L'Etoile, FR;
Abstract
The invention relates to a method for observing a sample (), the sample () comprising a set of organisms (), a solid substrate () supporting the set of organisms (). The method being characterized in that the method includes steps for illuminating at least one portion of the sample () with a light beam, for acquiring a first diffraction pattern corresponding to an image of waves from the diffraction of the light beam by at least one portion of the set of organisms (), for acquiring a second diffraction pattern corresponding to an image of waves from the diffraction of the light beam by at least one portion of the sample (), for comparing the second diffraction pattern with the first diffraction pattern, for determining at least one characteristic relating to the set of organisms () from the result of the comparison step.