The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2021

Filed:

Jun. 08, 2016
Applicant:

Konica Minolta Laboratory U.s.a., Inc., San Mateo, CA (US);

Inventors:

Leiming Wang, Foster City, CA (US);

Po-Chieh Hung, Cupertino, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/3504 (2014.01); G01J 3/42 (2006.01); G01N 33/00 (2006.01); G01N 33/22 (2006.01); G01J 3/02 (2006.01); G01J 3/36 (2006.01); G01J 3/12 (2006.01); G01J 3/28 (2006.01); G01N 33/24 (2006.01);
U.S. Cl.
CPC ...
G01N 21/3504 (2013.01); G01J 3/42 (2013.01); G01N 33/0063 (2013.01); G01N 33/225 (2013.01); G01J 3/0264 (2013.01); G01J 3/36 (2013.01); G01J 2003/1239 (2013.01); G01J 2003/2826 (2013.01); G01J 2003/2836 (2013.01); G01N 33/0047 (2013.01); G01N 33/241 (2013.01); G01N 2201/124 (2013.01); G01N 2201/1247 (2013.01);
Abstract

A system and method for multi-spectral gas concentration analysis that includes using a library of multiple sets of optimized spectral sensitivities prepared in advance, and a multi-spectral IR gas analyzer tuned to a set of optimized spectral sensitivity. The multi-spectral IR gas analyzer measures spectral absorption of gas using one or more different sets of optimized spectral sensitivities.


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