The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2021

Filed:

Feb. 22, 2018
Applicant:

Fuji Electric Co., Ltd., Kanagawa, JP;

Inventors:

Naoki Takeda, Yokohama, JP;

Bo Li, Hachioji, JP;

Yoshiki Hasegawa, Hino, JP;

Kazuhiro Koizumi, Sagamihara, JP;

Yu Kawamura, Hino, JP;

Assignee:

FUJI ELECTRIC CO., LTD., Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/02 (2006.01); G01N 33/00 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0272 (2013.01); G01N 33/0032 (2013.01); G01N 2015/0046 (2013.01);
Abstract

An analyzing device is provided, which can accurately analyze information related to generation sources. A generation source analyzing device is provided, which includes a measurement value acquiring unit to acquire time-series measurement values of a concentration of each of a plurality of measured object components at a measurement point, a correlation calculating unit to calculate a correlation value between the time-series measurement values of at least one set of the measured object components, and a generation source analyzing unit to analyze information related to generation sources of at least one measured object component based on the correlation value calculated by the correlation calculating unit.


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