The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2021
Filed:
Jun. 29, 2018
Wuhan China Star Optoelectronics Semiconductor Display Technology Co., Ltd., Hubei, CN;
Guodong Jiang, Guangdong, CN;
Abstract
Discloses is a pressure and hardness tester of a planar material, comprising a base, a stage, a test frame and a test device. The test piece is flatly extended and fixed on the stage. The test frame comprises a floor stand and a cross bar hinged by a rotating shaft. The floor stand and the stage are fixedly connected with the base. One end of the cross bar is provided with a balance weight and the other end of the cross bar is provided with a counterweight and a connecting part. The connecting part is used to connect the test device including a pressure test assembly or a hardness test assembly and make the test device right opposite to the stage. After the cross bar rotates about the rotating shaft, the test device contacts with the test piece for testing a pressure resistance or a hardness of the test piece.