The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2021
Filed:
Jan. 06, 2020
Apple Inc., Cupertino, CA (US);
Daniel J. Fritchman, San Francisco, CA (US);
Jafar Savoj, Sunnyvale, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
Reference center circuitry for a metrology system is disclosed. In one embodiment, the circuitry includes a reference sensor having a topology and characteristics identical to a number of sensors throughout an IC. The both the reference sensor and the sensors on the IC may be used to perform voltage and temperature measurements. The reference sensor may receive a voltage from a precision voltage supply, and may be used as a sensor to provide a basis for calibrating the other sensors, as well. Thereafter, temperature readings obtained from the other sensors may be correlated to the readings obtained by the reference sensor for enhanced accuracy. The reference center circuitry also includes analog process monitoring circuitry, which may be coupled to some, if not all of the transistors implemented on an IC.