The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2021
Filed:
May. 23, 2016
Endress+hauser Gmbh+co. KG, Maulburg, DE;
Ghislain Daufeld, Village Neuf, FR;
Jens Merle, Schopfheim, DE;
Markus Vogel, Schopfheim, DE;
Alexey Malinovskiy, Maulburg, DE;
Stefan Gorenflo, Hausen, DE;
ENDRESS+HAUSER SE+CO.KG, Maulburg, DE;
Abstract
A method for checking the functional ability of an FMCW-based fill-level measuring device, which serves for measuring the fill level of a fill substance located in a container, as well as to a fill-level measuring device suitable for performing this method. For checking the functional ability, a microwave signal is produced, whose frequency change differs from the frequency change of the measurement signal used during regular measurement operation. By comparing the frequency of the difference signal resulting from the microwave signal with a predetermined reference frequency, it is ascertained, whether the fill-level measuring device is functionally able. Thus, the fill-level measuring device detects, independently, whether it is functionally able, or whether an error is present, caused principally by device-internal disturbance signals. This offers, especially, a clear advantage as regards meeting safety standards for the field device.