The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2021

Filed:

Jul. 25, 2019
Applicant:

Applied Invention, Llc, Burbank, CA (US);

Inventors:

Adrian Kaehler, Los Feliz, CA (US);

Kjerstin Williams, Los Angeles, CA (US);

Mark E. Duttweiler, Sherman Oaks, CA (US);

Assignee:

APPLIED INVENTION, LLC, Burbank, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01C 21/34 (2006.01); B60W 30/00 (2006.01); G05D 1/02 (2020.01);
U.S. Cl.
CPC ...
G01C 21/3407 (2013.01); B60W 30/00 (2013.01); G01C 21/34 (2013.01); G05D 1/0212 (2013.01); G05D 2201/0213 (2013.01);
Abstract

A plan through a space having a near field and a far field is determined. Using a sensor device, measurements of the far field are obtained and stored in an electronic memory. A processor uses the measurements to determine the viability of each far field plan among a plurality of candidate far field plans. The processor also determines a flexibility score for each of the candidate far field plans and selects a composite plan comprising the viable far field plan having a highest flexibility score among the viable candidate far field plans.


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