The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2021

Filed:

Dec. 04, 2019
Applicant:

United Technologies Corporation, Farmington, CT (US);

Inventor:

JinQuan Xu, East Greenwich, RI (US);

Assignee:

Raytheon Technologies Corporation, Farmington, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B33Y 50/02 (2015.01); G01N 29/12 (2006.01); G01N 29/44 (2006.01); G01N 29/04 (2006.01); B33Y 10/00 (2015.01); G01H 13/00 (2006.01); B22F 10/00 (2021.01); B33Y 30/00 (2015.01); B22F 3/24 (2006.01); F01D 5/00 (2006.01); F01D 5/28 (2006.01); B23K 15/00 (2006.01); F01D 5/14 (2006.01); F01D 9/02 (2006.01); F01D 11/08 (2006.01); B22F 10/10 (2021.01);
U.S. Cl.
CPC ...
B33Y 50/02 (2014.12); B22F 3/24 (2013.01); B22F 10/00 (2021.01); B23K 15/0026 (2013.01); B23K 15/0086 (2013.01); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); F01D 5/005 (2013.01); F01D 5/147 (2013.01); F01D 5/286 (2013.01); F01D 5/288 (2013.01); F01D 9/02 (2013.01); F01D 11/08 (2013.01); G01H 13/00 (2013.01); G01N 29/043 (2013.01); G01N 29/12 (2013.01); G01N 29/4427 (2013.01); G01N 29/4436 (2013.01); B22F 10/10 (2021.01); B22F 2003/247 (2013.01); B22F 2999/00 (2013.01); F05D 2220/32 (2013.01); F05D 2230/22 (2013.01); F05D 2230/232 (2013.01); F05D 2230/234 (2013.01); F05D 2230/30 (2013.01); F05D 2230/31 (2013.01); F05D 2260/96 (2013.01); Y02P 10/25 (2015.11);
Abstract

A method of additive manufacturing comprises determining a first resonant frequency of an unflawed reference workpiece at a first partial stage of completion, fabricating a production workpiece to the first partial stage of completion via additive manufacture, sensing a second resonant frequency of the production workpiece in-situ at the first partial stage of completion, during the fabrication, analyzing the workpiece for flaws based on comparison of the first and second resonant frequencies, and providing an output indicative of production workpiece condition, based on the analysis. An additive manufacturing system comprises an additive manufacturing tool, a sensor, and a controller. The additive manufacturing tool is disposed to construct a workpiece via iterative layer deposition. The sensor is disposed to determine a resonant frequency of the workpiece in-situ at the additive manufacturing tool, during fabrication. The controller is configured to terminate manufacture of the workpiece if the resonant frequency differs substantially from a reference frequency.


Find Patent Forward Citations

Loading…