The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2021

Filed:

Jun. 25, 2015
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventor:

Ewald Roessl, Henstedt-Ulzburg, DE;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G01T 1/17 (2006.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
A61B 6/4241 (2013.01); A61B 6/032 (2013.01); A61B 6/482 (2013.01); A61B 6/5205 (2013.01); G01T 1/17 (2013.01); A61B 6/4233 (2013.01); A61B 6/58 (2013.01);
Abstract

A method of processing a signal measured by an energy-resolving detector after passage of radiation through a sample includes receiving a measured count rate for photonic interactions with the detector, fitting a signal model to the detected counts, wherein the signal model is configured to account for a pulse-pile-up effect, the signal model representing a conditional expectation of a frequency of at least uni-directional pulse crossing of at least one energy level, given a physical quantity of a material in the sample, wherein the signal model is expressed in terms of a Fourier representation of a pulse height variable.


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Roessl, Ewald. (2021). Spectral material decomposition for photon-counting applications (U.S. Patent No. 11020070). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11020070

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