The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2021

Filed:

Nov. 25, 2013
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Wei Zhang, Eindhoven, NL;

Warner Rudolph Theophile Ten Kate, Waalre, NL;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/11 (2006.01); G16H 50/30 (2018.01);
U.S. Cl.
CPC ...
A61B 5/1117 (2013.01); A61B 5/6801 (2013.01); A61B 5/7246 (2013.01); A61B 5/7275 (2013.01); G16H 50/30 (2018.01); A61B 2560/0257 (2013.01); A61B 2562/0219 (2013.01);
Abstract

There is provided a method of estimating the fall risk of a user, the method comprising analyzing measurements of the acceleration of the user to determine if the user has performed a sit-to-stand transfer; identifying the peak vertical acceleration of the user during the sit-to-stand transfer from the measurements of the acceleration of the user; and estimating a fall risk for the user from the identified peak vertical acceleration.


Find Patent Forward Citations

Zhang, Wei. (2021). Method and apparatus for estimating the fall risk of a user (U.S. Patent No. 11020023). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11020023

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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