The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2021

Filed:

Feb. 21, 2019
Applicant:

Nidek Co., Ltd., Gamagori, JP;

Inventors:

Yukihiro Higuchi, Okazaki, JP;

Tetsuya Kano, Kariya, JP;

Ryosuke Shiba, Gamagori, JP;

Assignee:

NIDEK CO., LTD., Gamagori, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/14 (2006.01); A61B 5/00 (2006.01); A61B 3/00 (2006.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01); A61B 3/0058 (2013.01); A61B 3/14 (2013.01); A61B 5/004 (2013.01); A61B 5/0066 (2013.01);
Abstract

An OCT data processing device includes a processor that performs acquiring three-dimensional OCT data. The three-dimensional OCT data is OCT data of a tissue of a subject's eye acquired by an OCT device and is obtained by irradiating measurement light on a two-dimensional measurement region. The two-dimensional measurement region extends in a direction intersecting an optical axis of the measurement light. The processor further preforms setting a line pattern, from among a plurality of types of line pattern, with respect to the two-dimensional measurement region for which the three-dimensional OCT data is obtained, at least one of an arrangement, a number, or a shape of one or more lines being different for the plurality of types of line pattern, and extracting, from the three-dimensional OCT data, a two-dimensional tomographic image of a cross section intersecting each of the one or more lines of the set line pattern.


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