The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2021
Filed:
Sep. 30, 2019
Facebook, Inc., Menlo Park, CA (US);
Guan Pang, Sunnyvale, CA (US);
Jing Huang, Redwood City, CA (US);
Balmanohar Paluri, Newark, CA (US);
Brian Christopher Karrer, Takoma Park, MD (US);
Ismail Onur Filiz, El Cerrito, CA (US);
Birce Tezel, Redwood City, CA (US);
Nicolas Emilio Stier Moses, Palo Alto, CA (US);
Vishakan Ponnampalam, Palo Alto, CA (US);
Timothy Eric Danford, Redwood City, CA (US);
Facebook, Inc., Menlo Park, CA (US);
Abstract
In one embodiment, a method includes accessing a point cloud comprising a plurality of point-cloud points, each point-cloud point corresponding to a location on a surface of an object located in a region in a three-dimensional space, identifying, from the point cloud, a plurality of point clusters, each point cluster comprising a plurality of point-cloud points located within a grid segment on a two-dimensional grid derived from the three-dimensional space, selecting, for each point cluster, a set of point-cloud points from the plurality of point-cloud points in the point cluster, the set of point-cloud points being selected based on a predetermined threshold number of point-cloud points associated with an acceptable reduction in an error detection rate, and determining, for each point cluster, a structure classification based on the selected set of point-cloud points from the point cluster.