The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 25, 2021

Filed:

Mar. 05, 2019
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventor:

Shiho Nakahara, Nerima, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/08 (2009.01); H04B 17/309 (2015.01); H04B 1/10 (2006.01); H04L 27/26 (2006.01); H04W 52/34 (2009.01); H04W 52/36 (2009.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04L 27/2614 (2013.01); H04B 1/10 (2013.01); H04B 17/309 (2015.01); H04L 27/2666 (2013.01); H04L 43/16 (2013.01); H04W 24/08 (2013.01); H04W 52/346 (2013.01); H04W 52/367 (2013.01);
Abstract

A wireless analysis device includes a memory configured to store information on a frequency spectrum of an incoming wave and information on a plurality of edges including a rising and falling edges of a signal included in the incoming wave, and a processor coupled to the memory and configured to compare a power change amount of the frequency spectrum at a first edge of the plurality of edges with a first threshold value for each frequency, specify a frequency range in which the power change amount is larger than the first threshold value, set a second threshold value based on a sum of the power change amount within the frequency range, and specify a second edge in which a sum of powers in the frequency range changes over the second threshold value among the plurality of edges, the second edge having different directions of power change from the first edge.


Find Patent Forward Citations

Nakahara, Shiho. (2021). Wireless analysis device and wireless analysis method (U.S. Patent No. 11018915). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11018915

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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