The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 25, 2021

Filed:

Apr. 05, 2019
Applicant:

The Regents of the University of California, Oakland, CA (US);

Inventors:

Chang Liu, Davis, CA (US);

Xiaoguang Liu, Davis, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01); H04L 25/03 (2006.01); H04L 7/033 (2006.01);
U.S. Cl.
CPC ...
H04L 7/0087 (2013.01); H04L 7/0331 (2013.01); H04L 25/03063 (2013.01); H04L 2025/03509 (2013.01);
Abstract

The disclosed embodiments provide a system that implements a low-aperture-delay sampler. The system includes a sampler input, which receives an input signal, and a clock input, which receives a clock signal. The system also includes: a first sampling channel, which samples the input signal when the clock signal is low and is associated with a previous clock phase; and a second sampling channel, which samples the input signal when a rising edge is received in the clock signal, wherein the rising edge is associated with a present clock phase. The system additionally includes a combining mechanism, which combines outputs of the first and second sampling channels to produce a sampler output with a significantly reduced aperture delay.


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