The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 25, 2021

Filed:

Dec. 21, 2018
Applicant:

Didi Research America, Llc, Mountain View, CA (US);

Inventors:

Zafar Takhirov, Santa Clara, CA (US);

Yun Jiang, Mountain View, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/50 (2017.01); G06N 5/04 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
G06T 7/50 (2017.01); G06K 9/4604 (2013.01); G06N 5/046 (2013.01); G06T 2207/20081 (2013.01);
Abstract

Embodiments of the disclosure provide systems and methods for determining depth information in a two-dimensional (2D) image. An exemplary system may include a processor and a non-transitory memory storing instructions that, when executed by the processor, cause the system to perform the various operations. The operations may include receiving a first feature map based on the 2D image and applying an extraction network having a convolution operation and a pooling operation to the first feature map to obtain a second feature map. The operations may also include applying a reconstruction network having a deconvolution operation to the second feature map to obtain a depth map.


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