The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2021
Filed:
Jun. 04, 2019
Applicants:
Laonpeople Inc., Seongnam-si, KR;
Moon Seop Yum, Seoul, KR;
Inventors:
Moon seop Yum, Seoul, KR;
Tae Woong Kim, Seongnam-si, KR;
Jae Min Park, Seongnam-si, KR;
Suk Joong Lee, Seoul, KR;
Sung Bae Park, Seongnam-si, KR;
Assignee:
LAONPEOPLE INC., Seoul, KR;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01); G06N 20/00 (2019.01); G06K 9/52 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06K 9/52 (2013.01); G06N 20/00 (2019.01); G06T 2207/20081 (2013.01); G06T 2207/30196 (2013.01);
Abstract
Disclosed herein are an apparatus and method for analyzing a cephalometric image. The apparatus for analyzing a cephalometric image includes a control unit configured to extract a landmark point on a cephalometric image and to generate an analysis image, and memory configured to store the generated analysis image.