logo

For the Inventor, By the Inventor

The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11017523 B1

PDFFull Text
Date of Patent:
May. 25, 2021

Filed:

May. 24, 2019

Inspection device and ptp packaging machine

Applicant:

Ckd Corporation, Aichi, JP;

Inventors:

Yukihiro Taguchi, Aichi, JP;

Takamasa Ohtani, Aichi, JP;

Assignee:

CKD CORPORATION, Aichi, JP;

Attorney:

Osha Bergman Watanabe & Burton LLP

Primary Examiner:

Pinalben Patel

Int. Cl.
CPC ...
G06T 7/00 (2017.01); B32B 3/26 (2006.01); B32B 15/082 (2006.01); B32B 15/085 (2006.01); B32B 15/20 (2006.01); B65B 9/04 (2006.01); B65B 57/02 (2006.01); B65B 57/00 (2006.01); G01N 21/892 (2006.01); G01N 21/93 (2006.01); G01N 21/85 (2006.01); H04N 5/247 (2006.01); H04N 5/372 (2011.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); B32B 3/26 (2013.01); B32B 15/082 (2013.01); B32B 15/085 (2013.01); B32B 15/20 (2013.01); B65B 9/04 (2013.01); B65B 9/045 (2013.01); B65B 57/00 (2013.01); B65B 57/02 (2013.01); G01N 21/85 (2013.01); G01N 21/892 (2013.01); G01N 21/93 (2013.01); B32B 2439/80 (2013.01); G06T 2207/30108 (2013.01); H04N 5/247 (2013.01); H04N 5/372 (2013.01);
Abstract

An inspection device for inspecting an inspection object portion in a PTP sheet, the inspection device including: an irradiator that irradiates the inspection object portion with light; an imaging device that takes an image of the inspection object portion irradiated with the light; a processor that detects a defect in the inspection object portion from the taken image by using a predetermined luminance threshold value, and determines whether the inspection object portion is non-defective; a verification image generating circuit that generates a verification image in which a virtual defective image is placed in a non-defective image; and a threshold value verifier that causes the processor to determine whether the inspection object portion is non-defective or defective by using the verification image, in place of the image taken by the imaging device, and to verify the luminance threshold value based on a determination result by the processor.

Find Patent Forward Citations

Loading…