The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2021
Filed:
Jul. 02, 2019
Siemens Healthcare Gmbh, Erlangen, DE;
Christian Kaethner, Forchheim, DE;
Markus Kowarschik, Nuremberg, DE;
Annette Birkhold, Nuremberg, DE;
Christopher Rohkohl, Escaldes-Engordany, AD;
Michael Manhart, Fuerth, DE;
SIEMENS HEALTHCARE GMBH, Erlangen, DE;
Abstract
A solution for determination of a three-dimensional difference image dataset of an examination volume. Here two-dimensional real image datasets relating to the examination volume are received via an interface, each of the two-dimensional real image datasets including a two-dimensional x-ray projection of the examination volume in relation to a projection direction. Furthermore, the first difference image dataset is determined based on the two-dimensional real image datasets and based on a first trained function via a processing unit. Here the first difference image dataset is at least two-dimensional, in particular at least three-dimensional, in particular the first difference image dataset is three-dimensional or four-dimensional. The determination of the first difference image dataset based on the two-dimensional real image datasets and based on a trained function enables mask recordings of the examination volume to be dispensed with, and thus the x-ray load of the examination volume to be reduced.