The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 25, 2021

Filed:

Sep. 24, 2019
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Yugo Mochizuki, Kawasaki, JP;

Okinori Tsuchiya, Yokohama, JP;

Tatsuhiro Yamagata, Inagi, JP;

Kouta Murasawa, Yokohama, JP;

Kazuya Ogasawara, Yokohama, JP;

Toshiki Miyazaki, Tokyo, JP;

Masao Kato, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 15/02 (2006.01);
U.S. Cl.
CPC ...
G06K 15/027 (2013.01);
Abstract

An information processing apparatus processes image information printed by a printing apparatus. The information processing apparatus includes a data obtaining unit to obtain print data for printing a line-width detection image including first multiple patches. Each of the first multiple patches includes multiple lines at substantially equal intervals in a first direction, each line having a first width in the first direction and extending in a second direction intersecting the first. The first multiple patches include first and second patches. A first substantially equal interval between a first plurality of lines in the first patch differs from a second substantially equal interval between a second plurality of lines in the second. An information obtaining unit obtains information on a print result of the printed line-width detection image. A correction unit corrects widths of lines in the first direction included in an image to be printed based on the obtained information.


Find Patent Forward Citations

Loading…