The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 25, 2021

Filed:

Mar. 14, 2018
Applicant:

Honeywell International Inc., Morris Plains, NJ (US);

Inventors:

Matthew Burd, Calgary, CA;

Damian Marshall, Nedlands, AU;

Jan Pingel, Weddington, NC (US);

Assignee:

Honeywell International Inc., Morris Plains, NJ (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/38 (2019.01); G06F 40/205 (2020.01);
U.S. Cl.
CPC ...
G06F 16/381 (2019.01); G06F 40/205 (2020.01);
Abstract

A method and apparatus for mapping measurement tags to assets. At least one memory is configured to store a plurality of tags. At least one processor is configured to parse a database of the plurality of tags to identify patterns of terms, wherein the plurality of tags include one or more terms and are related to measurements performed by an asset in an industrial process control and automation system. The processor is further configured to display the plurality of tags grouped by the identified patterns of terms. The processor is further configured to receive an input to map the tag related to the asset based on the identified patterns of terms. The processor is further configured to map the tag to the asset based on the input.


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