The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 25, 2021

Filed:

Jul. 25, 2018
Applicant:

Technion Research & Development Foundation Limited, Haifa, IL;

Inventors:

Ilya Kolchinsky, Ashdod, IL;

Assaf Schuster, Haifa, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/2455 (2019.01); G06F 16/22 (2019.01); G06F 16/2453 (2019.01);
U.S. Cl.
CPC ...
G06F 16/24568 (2019.01); G06F 16/2246 (2019.01); G06F 16/2456 (2019.01); G06F 16/24542 (2019.01);
Abstract

A method for detecting a pattern of events, comprising: receiving a template defining the pattern of events to detect; producing a join query for a relational database from the template; selecting a cost function for the join query, wherein a computation cost of the join query is equivalent to a computation cost of matching between a plurality of events from a plurality of streams of events and the template; identifying a preferred plan for executing the join query according to a minimal value of the cost function; producing an ordered set of a plurality of patterns, according to the preferred plan, by converting a plurality of database operations of the preferred plan into the ordered set of the plurality of patterns; and using the ordered set as an input for detecting a plurality of matches between the plurality of patterns and the plurality of events.


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