The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 25, 2021

Filed:

Aug. 07, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

James A. Ford, San Jose, CA (US);

Lakshman R. Sakaray, Overland Park, KS (US);

Paul-John A. To, Olathe, KS (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/2453 (2019.01); G06F 16/242 (2019.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 16/2453 (2019.01); G06F 11/362 (2013.01); G06F 16/2425 (2019.01);
Abstract

Trace data is received for a first execution of a first query on first tables having first data values. Second data values are generated for second tables from the trace data and without accessing the first data values. The second data values are configured to reproduce, by a second execution of a second query, the evaluation states from the first execution. Evaluation states from the first execution are reproduced without accessing the first data values by performing the second execution of the second query on the second data values. The first execution evaluates only a first subset of the first data values and the generating the second data values from the trace data generates second data values corresponding to the first subset. The second execution only evaluates ones of the second data values that correspond to data values of the first subset.


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