The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 25, 2021

Filed:

Dec. 21, 2020
Applicant:

Sas Institute Inc., Cary, NC (US);

Inventors:

Rocco Claudio Cannizzaro, Cary, NC (US);

Christian Macaro, Raleigh, NC (US);

Assignee:

SAS INSTITUTE INC., Cary, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G06F 11/34 (2006.01); G06F 9/4401 (2018.01); G06K 9/62 (2006.01); G06F 9/38 (2018.01); G06F 9/48 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3452 (2013.01); G06F 9/3885 (2013.01); G06F 9/4401 (2013.01); G06F 9/4881 (2013.01); G06K 9/6256 (2013.01); G06K 9/6262 (2013.01);
Abstract

Resource consumption associated with executing a bootstrapping process on a computing device can be reduced. For example, a system can receive a dataset including observations. The system can then instantiate one or more thread objects configured to execute a bootstrapping process that involves multiple iterations. Each iteration can involve: determining a respective set of probabilities based on an observation distribution associated with the dataset, executing a function based on the respective set of probabilities to determine a respective metric value, and storing the respective metric value in memory. This iterative process may be faster and less computationally intensive than traditional bootstrapping approaches. After completing the iterative process, the system may access the memory to obtain the metric values, determine a distribution of metric values based on at least some of the metric values, and store the distribution of metric values in the memory for further use.


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