The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 25, 2021

Filed:

Mar. 20, 2018
Applicant:

Veritas Technologies Llc, Mountain View, CA (US);

Inventors:

Sushrut Gajbhiye, Pune, IN;

Deodatta Barhate, Pune, IN;

Roshan Kolhe, Wardha, IN;

Shailesh Marathe, Pune, IN;

Anindya Banerjee, Pune, IN;

Assignee:

Veritas Technologies LLC, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G06F 21/55 (2013.01); G06F 21/57 (2013.01);
U.S. Cl.
CPC ...
G06F 11/1088 (2013.01); G06F 11/1076 (2013.01); G06F 21/554 (2013.01); G06F 21/577 (2013.01); G06F 2221/034 (2013.01);
Abstract

The disclosed computer-implemented method for detecting bit rot in distributed storage devices having failure domains may include (1) receiving, at a computing device, a combination of data chunks created by adding, for each failure domain storing data chunks, data chunks from different stripes, (2) receiving a combination of parity chunks created by adding, for each failure domain storing parity chunks, parity chunks from the different stripes, (3) creating at least one new parity chunk from the combination of data chunks, and (4) identifying a presence of bit rot in the failure domains when the at least one new parity chunk does not match the combination of parity chunks. Various other methods, systems, and computer-readable media are also disclosed.


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