The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 25, 2021

Filed:

Feb. 25, 2019
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Li Sun, Chengdu, CN;

Fei Peng, Chengdu, CN;

Zhongyi Zhou, Chengdu, CN;

Fubin Zhang, Chengdu, CN;

Wenhao Dai, Chengdu, CN;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0709 (2013.01); G06F 11/0751 (2013.01); G06F 11/0787 (2013.01);
Abstract

Embodiments of the present disclosure provide methods, apparatus, and computer storage media for application error diagnosis. The method of application error diagnosis may include obtaining information related to an error in an application, generating a code of the information related to the error in the application, determining a similarity between the code and at least one predetermined code, wherein the at least one predetermined code is being associated with a known software bug. The method further includes determining at least one software bug related to the error in the application by comparing the similarity with a predetermined threshold.


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