The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 25, 2021

Filed:

Nov. 29, 2017
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Hidenori Yamamoto, Tokyo, JP;

Takeshi Handa, Tokyo, JP;

Yuko Yamashita, Tokyo, JP;

Kenji Kawasaki, Tokyo, JP;

Syuuichirou Sakikawa, Tokyo, JP;

Takashi Tsuno, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 8/70 (2018.01); G06Q 10/06 (2012.01); G16Z 99/00 (2019.01);
U.S. Cl.
CPC ...
G06F 8/70 (2013.01); G06Q 10/06 (2013.01); G06Q 10/067 (2013.01); G16Z 99/00 (2019.02);
Abstract

Proposal of data analysis components is enabled to be performed irrespective of the quantity of an implementation history of data analysis, and thus efficiency and cost reduction of production of software for data analysis are promoted. A data utilization platform serveris configured to includes a arithmetic devicewhich executes processing of generating analysis relationship information prescribing linkage between analysis target data and an analysis component executing analysis processing for the analysis target table on the basis of a relationship among a plurality pieces of the analysis target data collected from a plurality of predetermined systems; and processing of specifying a combination of a plurality of the analysis components available for predetermined data designated as an analysis target by a user on the basis of the analysis relationship information.


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