The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 25, 2021

Filed:

Aug. 24, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Vadim Berestetsky, North York, CA;

Allen V. Chan, Markham, CA;

Suman K. Kalia, Maple, CA;

Peter A. Lambros, Southampton, GB;

Stephen Rea, Winchester, GB;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 8/20 (2018.01); H04N 21/431 (2011.01); G06F 8/36 (2018.01);
U.S. Cl.
CPC ...
G06F 8/20 (2013.01); G06F 8/36 (2013.01); H04N 21/4316 (2013.01);
Abstract

An XML schema defining elements representing different point of variability (POV) types for points of variability of a pattern is provided. The elements belong to an XML schema POV data-type substitution group that allows the POV types to be substituted for one another. A pattern author is allowed to add new or custom POV data types to the substitution group, thereby allowing the pattern author to extend the pattern meta model to include new POV data types. Once the desired POV data types are defined, the pattern author is allowed to generate an instance of the pattern that applies programmatic operations of the new or custom POV data types created and substituted by the end user to each respective system object.


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