The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 25, 2021

Filed:

Jun. 29, 2018
Applicant:

Seagate Technology Llc, Cupertino, CA (US);

Inventors:

Stacey Secatch, Niwot, CO (US);

David W. Claude, Loveland, CO (US);

Assignee:

Seagate Technology LLC, Fremont, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G11C 5/02 (2006.01); G06F 11/34 (2006.01); G06F 9/48 (2006.01); G11C 11/4093 (2006.01); G11C 8/12 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0629 (2013.01); G06F 3/061 (2013.01); G06F 3/0659 (2013.01); G06F 3/0679 (2013.01); G06F 3/0683 (2013.01); G06F 9/4881 (2013.01); G06F 11/3409 (2013.01); G11C 5/025 (2013.01); G11C 8/12 (2013.01); G11C 11/4093 (2013.01);
Abstract

A data storage system can arrange semiconductor memory into a plurality of die sets where performance metrics of execution of a first data access command to a first die set and of a second data access command to a second die set are measured. A proactive strategy is generated to maintain consistent data access command execution performance with a quality of service module based on the measured performance metrics and a third data access command is altered, as directed by the proactive strategy, to prevent a predicted non-uniformity of data access command performance between the first die set and the second die set.


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