The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2021
Filed:
Sep. 20, 2019
Tableau Software, Inc., Seattle, WA (US);
Andrew Herbert Kritzer, San Carlos, CA (US);
Evan Michael McLain, Seattle, WA (US);
David Robert Potter, Bothell, WA (US);
Hermann Faith Chong, Redmond, WA (US);
Caleb Michael Predmore, Woodinville, WA (US);
Keith Ryan Jones, Redmond, WA (US);
Zachary Page Woodall, Seattle, WA (US);
Zhe Zhang, Redmond, WA (US);
Tableau Software, Inc., Seattle, WA (US);
Abstract
A method visualizes data sources. A user selects a data source, and the computer system displays a first data visualization according to placement of data fields in shelves of the user interface. The data visualization comprises visual data marks representing the data source. A user selects some of the data marks. In response, the system displays a metric window including a data metric object preview, a summary of the selected data marks, and setting controls. The user provides input to create the data metric object. In response, the system creates the data metric object, including: configuration parameters derived from the first data visualization; an initial extract from the data source according to the configuration parameters; and a schedule for recurring retrieval of data from the data source to update the extract. The system then displays a second data visualization according to the configuration parameters and the extract.