The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2021
Filed:
Feb. 07, 2020
Applicant:
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Inventors:
Florian Fahrbach, Mannheim, DE;
Werner Knebel, Kronau, DE;
Assignee:
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/06 (2006.01); G02B 21/16 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0032 (2013.01); G02B 21/002 (2013.01); G02B 21/0048 (2013.01); G02B 21/0076 (2013.01); G02B 21/06 (2013.01); G02B 21/16 (2013.01); G02B 21/367 (2013.01);
Abstract
A device is configured to carry out a method for examining a sample comprising: illuminating the sample in an illumination plane along an illumination strip by an illuminating light beam which propagates along the illumination strip, wherein the illuminating light beam is formed as a light sheet; projecting the illumination strip into a detection plane by detection light originating from the illumination strip being focused in the detection plane; and detecting the detection light by a detector. The detector is formed as a slit detector.