The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2021
Filed:
May. 29, 2019
Applicant:
Saudi Arabian Oil Company, Dhahran, SA;
Inventors:
Hongwei Liu, Dhahran, SA;
Mustafa Al-Ali, Bahrain, SA;
Assignee:
Saudi Arabian Oil Company, Dhahran, SA;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/00 (2006.01); G01V 1/50 (2006.01); E21B 49/00 (2006.01); G01V 1/28 (2006.01);
U.S. Cl.
CPC ...
G01V 1/003 (2013.01); E21B 49/00 (2013.01); G01V 1/282 (2013.01); G01V 1/50 (2013.01); G01V 2210/16 (2013.01); G01V 2210/21 (2013.01); G01V 2210/244 (2013.01); G01V 2210/46 (2013.01); G01V 2210/512 (2013.01); G01V 2210/614 (2013.01); G01V 2210/675 (2013.01);
Abstract
A method of generating target-oriented acquisition-imprint-free prestack angle gathers using common focus point (CFP) operators includes receiving a plurality of seismic traces associated with a target point in a reservoir. A first angle domain common image gather (ADCIG) is generated based on the received plurality of seismic traces. A plurality of synthetic traces associated with the target point is generated. A second ADCIG is generated based on the synthetic traces. An enhanced ADCIG is generated using the first ADCIG and the second ADCIG.