The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2021
Filed:
Apr. 27, 2016
Vayyar Imaging Ltd, Yehud, IL;
Damian Hoffman, Tzur Yitzhak, IL;
Yuval Lomnitz, Herzelia, IL;
Jonathan Rosenfeld, Ramat hasharon, IL;
VAYYAR IMAGING LTD., Yehud, IL;
Abstract
Systems, device and methods are provided for calibrating an antenna array comprising a plurality of antennas such as a plurality of transmit and receive antennas by utilizing an arena comprising one or more targets and a medium. The methods may comprise transmitting a plurality of Radio Frequency (RF) signals from at least one RF antenna of a plurality of RF antennas towards an arena, obtaining by the antenna array affected multiple RF signals from the arena, measuring the plurality of reflected RF signals by a Radio Frequency Signal Measurement Unit (RFSMU) and calculating a plurality of channel responses from said plurality of affected RF signals, providing by at least one processing unit a first model, which is configured to produce an expected electromagnetic (EM) channel responses of the antenna array and the arena and providing a second model, which comprises a relation between the first model and the antenna array calibration parameters and calculating the array calibration parameters to calibrate the antenna array.